Trapped-Ion Entangling Gates Robust Against Qubit Frequency Errors

Abstract

Entangling operations are a necessary tool for large-scale quantum information processing, but experimental imperfections can prevent current schemes from reaching sufficient fidelities as the number of qubits is increased. Here it is shown numerically how multi-toned generalizations of standard trapped-ion entangling gates can simultaneously be made robust against noise and mis-sets of the frequencies of the individual qubits. This relaxes the degree of homogeneity required in the trapping field, making physically larger systems more practical.

References in corpus (5)

• High-fidelity preparation, gates, memory and readout of a trapped-ion quantum bit
• Towards fault-tolerant quantum computing with trapped ions
• Quantum-enhanced machine learning
• High-fidelity trapped-ion quantum logic using near-field microwaves
• Robust and resource-efficient microwave near-field entangling ${}^9$Be${}^{+}$ gate