Trapped-Ion Entangling Gates Robust Against Qubit Frequency Errors
arXiv:2004.07253 · doi:10.1103/PhysRevResearch.2.033117
Abstract
Entangling operations are a necessary tool for large-scale quantum information processing, but experimental imperfections can prevent current schemes from reaching sufficient fidelities as the number of qubits is increased. Here it is shown numerically how multi-toned generalizations of standard trapped-ion entangling gates can simultaneously be made robust against noise and mis-sets of the frequencies of the individual qubits. This relaxes the degree of homogeneity required in the trapping field, making physically larger systems more practical.
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- Robust two-qubit trapped ions gates using spin-dependent squeezing
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