The Speedster-EXD- A New Event-Driven Hybrid CMOS X-ray Detector

Abstract

The Speedster-EXD is a new 64x64 pixel, 40 $\mu$m pixel pitch, 100 $\mu$m depletion depth hybrid CMOS X-ray detector (HCD) with the capability of reading out only those pixels containing event charge, thus enabling fast effective frame rates. A global charge threshold can be specified, and pixels containing charge above this threshold are flagged and read out. The Speedster detector has also been designed with other advanced in-pixel features to improve performance, including a low-noise, high-gain CTIA amplifier that eliminates interpixel capacitance crosstalk (IPC), and in-pixel Correlated Double Sampling (CDS) subtraction to reduce reset noise. We measure the best energy resolution on the Speedster-EXD detector to be 206 eV (3.5 %) at 5.89 keV and 172 eV (10.0 %) at 1.49 keV. The average IPC to the four adjacent pixels is measured to be 0.25 $\pm$ 0.2 % (i.e. consistent with zero). The pixel-to-pixel gain variation is measured to be 0.80 $\pm$ 0.03 %, and a Monte Carlo simulation is applied to better characterize the contributions to the energy resolution.

arXiv comment24 pages, 14 figures. Accepted for publication in the Journal of Astronomical Telescopes, Instruments, and Systems

References in corpus (8)

• The Wide-field Infrared Survey Explorer (WISE): Mission Description and Initial On-orbit Performance
• The Swift X-ray Telescope
• Enduring Quests-Daring Visions (NASA Astrophysics in the Next Three Decades)
• Characterization of Si Hybrid CMOS Detectors for use in the Soft X-ray Band
• Long-term trends in radiation damage of Chandra X-ray CCDs
• Characterization of an x-ray hybrid CMOS detector with low interpixel capacitive crosstalk
• Recent Progress on Developments and Characterization of Hybrid CMOS X-ray Detectors
• Measurements of Si Hybrid CMOS X-Ray Detector Characteristics

Cited by in corpus (6)

• Hybrid CMOS detectors for the Lynx x-ray surveyor high definition x-ray imager
• X-ray Hybrid CMOS Detectors: Recent Development and Characterization Progress
• Gamma-Ray Polarimetry
• Initial Characterization of the First Speedster-EXD550 Event-Driven X-Ray Hybrid Complementary Metal-Oxide Semiconductor Detectors
• Measuring the Quantum Efficiency of X-Ray Hybrid CMOS Detectors
• Hard X-ray Polarimetry -- An overview of the method, science drivers and recent findings