High-fidelity resonator-induced phase gate with single-mode squeezing

Abstract

We propose to increase the fidelity of two-qubit resonator-induced phase gates in circuit QED by the use of narrowband single-mode squeezed drive. We show that there exists an optimal squeezing angle and strength that erases qubit 'which-path' information leaking out of the cavity and thereby minimizes qubit dephasing during these gates. Our analytical results for the gate fidelity are in excellent agreement with numerical simulations of a cascaded master equation that takes into account the dynamics of the source of squeezed radiation. With realistic parameters, we find that it is possible to realize a controlled-phase gate with a gate time of 200 ns and average infidelity of $10^{-5}$.

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• Towards a heralded eigenstate preserving measurement of multi-qubit parity in circuit QED
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• Robust Oscillator-Mediated Phase Gates Driven by Low-Intensity Pulses