Titanium trisulfide monolayer: A new direct-gap semiconductor with high and anisotropic carrier mobility
arXiv:1501.02313 · doi:10.1002/anie.201502107
Abstract
A new two-dimensional (2D) layered material, namely, titanium trisulfide (TiS) monolayer sheet, is predicted to possess desired electronic properties for nanoelectronic applications. On basis of the first-principles calculations within the framework of density functional theory and deformation theory, we show that the TiS 2D crystal is a direct gap semiconductor with a band gap of 1.06 eV and high carrier mobility. More remarkably, the in-plane electron mobility of the 2D TiS is highly anisotropic, amounting to 10,000 cmVs in the \emph{b} direction, which is higher than that of the MoS monolayer. Meanwhile, the hole mobility is about two orders of magnitude lower. We also find that bulk TiS possesses lower cleavage energy than graphite, indicating high possibility of exfoliation for TiS monolayers or multilayers. Both dynamical and thermal stability of the TiS monolayer is examined via phonon-spectrum calculation and Born-Oppenheimer molecular dynamics simulation in \emph{NPT} ensemble. The predicted novel electronic properties render the TiS monolayer an attractive 2D material for applications in future nanoelectronics.
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