Molecular beam epitaxy growth and scanning tunneling microscopy study of TiSe ultrathin films
arXiv:1412.8551 · doi:10.1103/PhysRevB.91.121113
Abstract
Molecular beam epitaxy is used to grow TiSe2 ultrathin films on graphitized SiC(0001) substrate. TiSe2films proceed via a nearly layer-by-layer growth mode and exhibit two dominant types of defects, identified as Se vacancy and interstitial, respectively. By means of scanning tunneling microscopy, we demonstrate that the well-established charge density waves can survive in single unit-cell (one triple layer) regime, and find a gradual reduction in their correlation length as the density of surface defects in TiSe2 ultrathin films increases. Our findings offer important insights into the nature of charge density wave in TiSe2, and also pave a material foundation for potential applications based on the collective electronic states.
5 pages, 4 figures
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Cited by in corpus (9)
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- Charge density waves and Fermi level pinning in monolayer and bilayer SnSe
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- Topological theory of inversion-breaking charge-density-wave monolayer 1\textit{T}-TiSe
- Chiral charge density wave and backscattering-immune orbital texture in monolayer 1T-TiTe2
- Substrate pre-sputtering for layer-by-layer van der Waals epitaxy of 2D materials