Pre-determining the location of electromigrated gaps by nonlinear optical imaging
arXiv:1406.2833 · doi:10.1063/1.4890415
Abstract
In this paper we describe a nonlinear imaging method employed to spatially map the occurrence of constrictions occurring on an electrically-stressed gold nanowire. The approach consists at measuring the influence of a tightly focused ultrafast pulsed laser on the electronic transport in the nanowire. We found that structural defects distributed along the nanowire are efficient nonlinear optical sources of radiation and that the differential conductance is significantly decreased when the laser is incident on such electrically-induced morphological changes. This imaging technique is applied to pre-determined the location of the electrical failure before it occurs.
arXiv comment3 figures
References in corpus (9)
- Optical Rectification and Field Enhancement in a Plasmonic Nanogap
- Controlled Fabrication of Nanogaps in Ambient Environment for Molecular Electronics
- Electrical excitation of surface plasmons
- Metal-nanoparticle single-electron transistors fabricated using electromigration
- The role of Joule heating in the formation of nanogaps by electromigration
- Temperature Control of Electromigration to form Gold Nanogap Junctions
- Nonlinear Optical Rectennas
- Feedback controlled electromigration in four-terminal nano-junctions
- Electron-induced limitation of surface plasmon propagation in silver nanowires