Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy

Abstract

High-resolution X-ray photoemission electron microscopy (X-PEEM) is a well-established method for imaging ferroelectric domain structures. Here, we expand the scope of application of X-PEEM and demonstrate its capability for imaging and investigating domain walls in ferroelectrics with high-spatial resolution. Using ErMnO3 as test system, we show that ferroelectric domain walls can be visualized based on photo-induced charging effects and local variations in their electronic conductance can be mapped by analyzing the energy distribution of photoelectrons. Our results open the door for non-destructive, contract-free, and element-specific studies of the electronic and chemical structure at domain walls in ferroelectrics.

References in corpus (2)

• Conduction at domain walls in insulating Pb(Zr${}_{0.2}$Ti${}_{0.8}$)O${}_3$ thin films
• Thickness-dependent polarization of strained BiFeO3 films with constant tetragonality

Cited by in corpus (3)

• Aperiodic topological order in the domain configurations of functional materials
• Conductivity contrast and tunneling charge transport in the vortex-like ferroelectric domain patterns of multiferroic hexagonal YMnO3
• Electrostatic potential mapping at ferroelectric domain walls by low-temperature photoemission electron microscopy