Heating and ion transport in a Y-junction surface-electrode trap
arXiv:1403.4874 · doi:10.1103/PhysRevA.89.062308
Abstract
We measure ion heating following transport throughout a Y-junction surface-electrode ion trap. By carefully selecting the trap voltage update rate during adiabatic transport along a trap arm, we observe minimal heating relative to the anomalous heating background. Transport through the junction results in an induced heating between 37 and 150 quanta in the axial direction per traverse. To reliably measure heating in this range, we compare the experimental sideband envelope, including up to fourth-order sidebands, to a theoretical model. The sideband envelope method allows us to cover the intermediate heating range inaccessible to the first-order sideband and Doppler recooling methods. We conclude that quantum information processing in this ion trap will likely require sympathetic cooling in order to support high fidelity gates after junction transport.
14 pages, 5 figures
References in corpus (10)
- A microfabricated surface-electrode ion trap for scalable quantum information processing
- Scaling and Suppression of Anomalous Quantum Decoherence in Ion Traps
- Simplified motional heating rate measurements of trapped ions
- Fabrication and heating rate study of microscopic surface electrode ion traps
- Deterministic entanglement and tomography of ion spin qubits
- Efficient Fiber Optic Detection of Trapped Ion Fluorescence
- Design, Fabrication, and Experimental Demonstration of Junction Surface Ion Traps
- Controlling trapping potentials and stray electric fields in a microfabricated ion trap through design and compensation
- Cryogenic Ion Trapping Systems with Surface-Electrode Traps
- Demonstration of a microfabricated surface electrode ion trap