Thermal Interface Conductance between Aluminum and Silicon by Molecular Dynamics Simulations
arXiv:1401.5550 · doi:10.1166/jctn.2015.3710
Abstract
The thermal interface conductance between Al and Si was simulated by a non-equilibrium molecular dynamics method. In the simulations, the coupling between electrons and phonons in Al are considered by using a stochastic force. The results show the size dependence of the interface thermal conductance and the effect of electron-phonon coupling on the interface thermal conductance. To understand the mechanism of interface resistance, the vibration power spectra are calculated. We find that the atomic level disorder near the interface is an important aspect of interfacial phonon transport, which leads to a modification of the phonon states near the interface. There, the vibrational spectrum near the interface greatly differs from the bulk. This change in the vibrational spectrum affects the results predicted by AMM and DMM theories and indicates new physics is involved with phonon transport across interfaces. Keywords:
Journal of Computational and Theoretical Nanoscience 2014
Cited by in corpus (11)
- Experimental metrology to obtain thermal phonon transmission coefficients at solid interfaces
- Generalized two-temperature model for coupled phonons
- A Modified Theoretical Model to Predict the Thermal Interface Conductance Considering Interface Roughness
- Thermal Boundary Resistance Measurement and Analysis Across SiC/SiO2 Interface
- Maximization and Minimization of Interfacial Thermal Conductance by Modulating the Mass Distribution of Interlayer
- First-principles based analysis of thermal transport in metallic nanostructures: size effect and Wiedemann-Franz law
- Evaluation of diffuse mismatch model for phonon scattering at disordered interfaces
- Effect of Electron-Phonon Coupling on Thermal Transport across Metal-Nonmetal Interface - A Second Look
- Role of the electron-phonon coupling in tuning the thermal boundary conductance at metal-dielectric interfaces by inserting ultrathin metal interlayers
- Calculation of Kapitza resistance with kinetic equation
- Revealing Phonon Bridge Effect for Amorphous vs Crystalline Metal-Silicide Layers at Si/Ti Interfaces by a Machine Learning Potential