Experimental metrology to obtain thermal phonon transmission coefficients at solid interfaces

Abstract

Interfaces play an essential role in phonon-mediated heat conduction in solids, impacting applications ranging from thermoelectric waste heat recovery to heat dissipation in electronics. From the microscopic perspective, interfacial phonon transport is described by transmission coefficients that link vibrational modes in the materials composing the interface. However, direct experimental determination of these coefficients is challenging because most experiments provide a mode-averaged interface conductance that obscures the microscopic detail. Here, we report a metrology to extract thermal phonon transmission coefficients at solid interfaces using ab-initio phonon transport modeling and a thermal characterization technique, time-domain thermoreflectance. In combination with transmission electron microscopy characterization of the interface, our approach allows us to link the atomic structure of an interface to the spectral content of the heat crossing it. Our work provides a useful perspective on the microscopic processes governing interfacial heat conduction.

arXiv admin note: substantial text overlap with arXiv:1509.07806

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• Atomistic S-matrix method for numerical simulation of phonon reflection, transmission and boundary scattering
• Interfacial Phonon Scattering and Transmission Loss in >1 um Thick Silicon-on-insulator Thin Films
• Heat dissipation in the quasiballistic regime studied using Boltzmann equation in the spatial frequency domain
• Critical angle for interfacial phonon scattering: Results from ab initio lattice dynamics calculations
• Unifying first principle theoretical predictions and experimental measurements of size effects on thermal transport in SiGe alloys
• Role of the electron-phonon coupling in tuning the thermal boundary conductance at metal-dielectric interfaces by inserting ultrathin metal interlayers
• Understanding Phonon Transport Properties Using Classical Molecular Dynamics Simulations
• Substrate-Dependence of Monolayer MoS${}_2$ Thermal Conductivity and Thermal Boundary Conductance
• Unique Reconstruction of the Heat-Reflection Indices at Solid Interfaces
• Quantitatively Predicting Modal Thermal Conductivity of Nanocrystalline Si by full band Monte Carlo simulations
• Characterization of self-heating in cryogenic high electron mobility transistors using Schottky thermometry