Nanoscale fluorescence lifetime imaging with a single diamond NV center
arXiv:1303.1204 · doi:10.1021/nl401791v
Abstract
Solid-state quantum emitters, such as artificially engineered quantum dots or naturally occurring defects in solids, are being investigated for applications ranging from quantum information science and optoelectronics to biomedical imaging. Recently, these same systems have also been studied from the perspective of nanoscale metrology. In this letter we study the near-field optical properties of a diamond nanocrystal hosting a single nitrogen vacancy center. We find that the nitrogen vacancy center is a sensitive probe of the surrounding electromagnetic mode structure. We exploit this sensitivity to demonstrate nanoscale fluorescence lifetime imaging microscopy (FLIM) with a single nitrogen vacancy center by imaging the local density of states of an optical antenna.
12 pages, 4 figures and supporting information
References in corpus (4)
- On-command enhancement of single molecule fluorescence using a gold nanoparticle as an optical nano-antenna
- Suitability of nanodiamond NV centers for spontaneous emission control experiments
- Near-field optical microscopy with a nanodiamond-based single photon tip
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Cited by in corpus (10)
- Optomechanics with Levitated Particles
- Mapping and Quantifying Electric and Magnetic Dipole Luminescence at the nanoscale
- Photophysics of single nitrogen-vacancy centers in diamond nanocrystals
- Direct Measurement of Quantum Efficiency of Single Photon Emitters in Hexagonal Boron Nitride
- Probing plasmon-NV coupling at the nanometer scale with photons and fast electrons
- Near-field microscopy with a scanning nitrogen-vacancy color center in a diamond nanocrystal: A brief review
- Probing near-field light-matter interactions with single-molecule lifetime imaging
- Chiral optical Local Density of States in spiral plasmonic cavity
- Optical far-field super-resolution microscopy using nitrogen vacancy center ensemble in bulk diamond
- A polarizing situation: Taking an in-plane perspective for next-generation near-field studies