Multiplet resonance lifetimes in resonant inelastic X-ray scattering involving shallow core levels

Abstract

Resonant inelastic X-ray scattering (RIXS) spectra of model copper- and nickel-based transition metal oxides are measured over a wide range of energies near the M-edge (h$\nu$=60-80eV) to better understand the properties of resonant scattering involving shallow core levels. Standard multiplet RIXS calculations are found to deviate significantly from the observed spectra. However, by incorporating the self consistently calculated decay lifetime for each intermediate resonance state within a given resonance edge, we obtain dramatically improved agreement between data and theory. Our results suggest that these textured lifetime corrections can enable a quantitative correspondence between first principles predictions and RIXS data on model multiplet systems. This accurate model is also used to analyze resonant elastic scattering, which displays the elastic Fano effect and provides a rough upper bound for the core hole shake-up response time.

6 pages, 3 figures

References in corpus (1)

• Ultrashort Lifetime Expansion for Indirect Resonant Inelastic X-ray Scattering

Cited by in corpus (6)

• Spectroscopic determination of the atomic f-electron symmetry underlying hidden order in URu${}_2$Si${}_2$
• Xclaim: a graphical interface for the calculation of core-hole spectroscopies
• Experimental signatures of phase interference and sub-femtosecond time dynamics on the incident energy axis of resonant inelastic X-ray scattering
• Charge transfer excitations in VUV and soft X-ray resonant scattering spectroscopies
• Irreversible proliferation of magnetic moments at cleaved surfaces of the topological Kondo insulator SmB6
• High resolution resonant inelastic EUV scattering from orbital excitations in a Heisenberg antiferromagnet