Multiplet resonance lifetimes in resonant inelastic X-ray scattering involving shallow core levels

Abstract

Resonant inelastic X-ray scattering (RIXS) spectra of model copper- and nickel-based transition metal oxides are measured over a wide range of energies near the M-edge (h$\nu$=60-80eV) to better understand the properties of resonant scattering involving shallow core levels. Standard multiplet RIXS calculations are found to deviate significantly from the observed spectra. However, by incorporating the self consistently calculated decay lifetime for each intermediate resonance state within a given resonance edge, we obtain dramatically improved agreement between data and theory. Our results suggest that these textured lifetime corrections can enable a quantitative correspondence between first principles predictions and RIXS data on model multiplet systems. This accurate model is also used to analyze resonant elastic scattering, which displays the elastic Fano effect and provides a rough upper bound for the core hole shake-up response time.

arXiv comment6 pages, 3 figures

References in corpus (3)

• Resonant Inelastic X-ray Scattering Studies of Elementary Excitations
• Resonant Inelastic X-Ray Scattering from Valence Excitations in Insulating Copper-Oxides
• Ultrashort Lifetime Expansion for Indirect Resonant Inelastic X-ray Scattering

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