Charge transfer excitations in VUV and soft X-ray resonant scattering spectroscopies

Abstract

The utility of resonant scattering spectroscopies for identifying electronic symmetries and density distributions changes dramatically as a function of photon energy. In the hard X-ray regime, strong core hole monopole potentials tend to produce X-ray absorption features with well defined electron number on the scattering site. By contrast, in the vacuum ultraviolet (VUV), resonant scattering from Mott insulators tends to reveal spectra that are characteristic of only the nominal valence, and are insensitive to deviations from nominal valence brought on by metal-ligand hybridization. Here, atomic multiplet simulations are used to investigate the interplay of monopolar and mulitpolar Coulomb interactions in the VUV and soft X-ray regimes, to identify how charge transfer thresholds and other signatures of mixed valence can manifest in this low photon energy regime. The study focuses on the Mott insulator NiO as a well characterized model system, and extrapolates interactions into non-physical regimes to identify principles that shape the spectral features.

References in corpus (3)

• Spectroscopic determination of the atomic f-electron symmetry underlying hidden order in URu${}_2$Si${}_2$
• Multiplet resonance lifetimes in resonant inelastic X-ray scattering involving shallow core levels
• Experimental signatures of phase interference and sub-femtosecond time dynamics on the incident energy axis of resonant inelastic X-ray scattering

Cited by in corpus (4)

• L-Edge Spectroscopy of Dilute, Radiation-Sensitive Systems Using a Transition-Edge-Sensor Array
• High temperature singlet-based magnetism from Hund's rule correlations
• Irreversible proliferation of magnetic moments at cleaved surfaces of the topological Kondo insulator SmB6
• High resolution resonant inelastic EUV scattering from orbital excitations in a Heisenberg antiferromagnet