Modeling quantum noise for efficient testing of fault-tolerant circuits

Abstract

Understanding fault-tolerant properties of quantum circuits is important for the design of large-scale quantum information processors. In particular, simulating properties of encoded circuits is a crucial tool for investigating the relationships between the noise model, encoding scheme, and threshold value. For general circuits and noise models, these simulations quickly become intractable in the size of the encoded circuit. We introduce methods for approximating a noise process by one which allows for efficient Monte Carlo simulation of properties of encoded circuits. The approximations are as close to the original process as possible without overestimating their ability to preserve quantum information, a key property for obtaining more honest estimates of threshold values. We numerically illustrate the method with various physically relevant noise models.

6 pages, 1 figure

References in corpus (3)

• Randomized Benchmarking of Quantum Gates
• Robust randomized benchmarking of quantum processes
• Symmetrised Characterisation of Noisy Quantum Processes

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