Modified electrical transport probe design for standard magnetometer

Abstract

Making electrical transport measurements on a material is often a time consuming process that involves testing a large number of samples. It is thus inconvenient to wire up and rewire samples on to a sample probe. We therefore present a method of modifying Quantum Design's MPMS SQUID magnetometer transport probe that simplifies the process of sample mounting. One of the difficulties to overcome is the small diameter of the sample space. A small socket is designed and mounted on the probe so that various samples mounted on individual headers can be readily exchanged in the socket. We also present some test results on the topological insulator Bi2Te2Se using the modified probe.

References in corpus (3)

• Gate-Voltage Control of Chemical Potential and Weak Anti-localization in Bismuth Selenide
• Impurity effect on weak anti-localization in the topological insulator Bi2Te3
• Large Coercivity in Nanostructured Rare-earth-free MnxGa Films

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• Signatures of dephasing by mirror-symmetry breaking in weak-antilocalization magnetoresistance across the topological transition in Pb${}_{1-x}$Sn${}_x$Se
• Electrical and magnetic properties of thin films of the spin-filter material CrVTiAl