Two-junction superconductor-normal metal single-electron trap in a combined on-chip RC environment
arXiv:1106.6005 · doi:10.1088/1742-6596/400/4/042040
Abstract
Dissipative properties of the electromagnetic environment as well as on-chip RC filtering are shown to suppress random state switchings in the two-junction superconductor(S) - normal metal(N) electron trap. In our experiments, a local high-ohmic resistor increased the hold time of the trap by up to two orders of magnitude. A strong effect of on-chip noise filtering was observed for different on-chip geometries. The obtained results are promising for realization of the current standard on the basis of the S-N hybrid turnstile.
4 pages 3 figures LT26