Quantifying the Stacking Registry Matching in Layered Materials

Abstract

A detailed account of a recently developed method [Marom et al., Phys. Rev. Lett. 105, 046801 (2010)] to quantify the registry mismatch in layered materials is presented. The registry index, which was originally defined for planar hexagonal boron-nitride, is extended to treat graphitic systems and generalized to describe multi-layered nanotubes. It is shown that using simple geometric considerations it is possible to capture the complex physical features of interlayer sliding in layered materials. The intuitive nature of the presented model and the efficiency of the related computations suggest that the method can be used as a powerful characterization tool for interlayer interactions in complex layered systems.

8 pages, 8 figures. To be published in a special issue of the Israel Journal of Chemistry regarding "Inorganic Nanotubes and Nanostructures"

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• Multiwalled nanotube faceting unravelled
• Interlayer Registry Determines the Sliding Potential of Layered Metal Dichalcogenides: The case of 2H-MoS2
• Nanotubes Motion on Layered Materials: A Registry Perspective
• Chemifriction and Superlubricity: Friends or Foes?
• Force and magnetic field sensor based on measurement of tunneling conductance between ends of coaxial carbon nanotubes
• Why twisting angles are diverse in graphene Moire patterns?