Quantifying the Stacking Registry Matching in Layered Materials
arXiv:1009.5639 · doi:10.1002/ijch.201000052
Abstract
A detailed account of a recently developed method [Marom et al., Phys. Rev. Lett. 105, 046801 (2010)] to quantify the registry mismatch in layered materials is presented. The registry index, which was originally defined for planar hexagonal boron-nitride, is extended to treat graphitic systems and generalized to describe multi-layered nanotubes. It is shown that using simple geometric considerations it is possible to capture the complex physical features of interlayer sliding in layered materials. The intuitive nature of the presented model and the efficiency of the related computations suggest that the method can be used as a powerful characterization tool for interlayer interactions in complex layered systems.
8 pages, 8 figures. To be published in a special issue of the Israel Journal of Chemistry regarding "Inorganic Nanotubes and Nanostructures"
References in corpus (6)
- Electric Field Effect in Atomically Thin Carbon Films
- Two Dimensional Atomic Crystals
- Giant Intrinsic Carrier Mobilities in Graphene and Its Bilayer
- Unconventional quantum Hall effect and Berry's phase of 2pi in bilayer graphene
- Thermal Conductivity and Thermal Rectification in Graphene Nanoribbons: a Molecular Dynamics Study
- Thermal conductance of graphene and dimerite