Penetration depth of electron-doped-infinite-layer SrLaCuO thin films
arXiv:1003.5559 · doi:10.1103/PhysRevB.82.144529
Abstract
The in-plane penetration depth of SrLaCuO thin films at various doping obtained from oxygen reduction has been measured, using AC susceptibility measurements. For the higher doping samples, the superfluid density deviates strongly from the s-wave behavior, suggesting, in analogy with other electron-doped cuprates, a contribution from a nodal hole pocket, or a small gap on the Fermi surface such as an anisotropic s-wave order parameter. The low value of the superfluid densities, likely due to a strong doping-induced disorder, places the superconducting transition of our samples in the phase-fluctuation regime.
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Cited by in corpus (4)
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- Phase-sensitive evidence for dx2-y2-pairing symmetry in the parent-structure high-Tc cuprate superconductor Sr1-xLaxCuO2
- Electric--field effect on electron-doped infinite-layer SrLaCuO thin films
- Manifestation of the magnetic moments of Cooper pairs in low-temperature properties of superconducting thin-film rings