Polarized Raman spectroscopy of nearly-tetragonal BiFeO thin films
arXiv:1003.2828 · doi:10.1103/PhysRevB.82.014107
Abstract
BiFeO thin films can be epitaxially stabilized in a nearly-tetragonal phase under a high biaxial compressive strain. Here we investigate the polarized Raman spectra of constrained BiFeO films with tetragonal-like (BFO-T), rhombohedral-like (BFO-R) and multiphase (BFO-T+R) structure. Based on analysis of the number and symmetry of the Raman lines, we provide strong experimental evidence that the nearly-tetragonal films are monoclinic ( symmetry) and not tetragonal . Through the Raman mapping technique we show localized coexistence of BFO-T and BFO-R phases with the relative fraction dependent on the film thickness.
4 pages, 4 figures, 1 table
References in corpus (5)
- The beta Phase of Multiferroic Bismuth Ferrite and its beta-gamma Metal-Insulator Transition
- Effect of epitaxial strain on the spontaneous polarization of thin film ferroelectrics
- Strain-induced isosymmetric phase transition in BiFeO3
- Electric field effect on BiFeO single crystal investigated by Raman spectroscopy
- Phonon Spectroscopy Near Phase Transition Temperatures in Multferroic BiFeO3 Epitaxial Thin Films
Cited by in corpus (9)
- Stress-induced R-MA-MC-T symmetry changes in BiFeO3 films
- A multiferroic on the brink: uncovering the nuances of strain-induced transitions in BiFeO
- A Nanoscale Shape Memory Oxide
- Phase transition close to room temperature in BiFeO3 thin films
- Anomalous low-energy phonons in nearly tetragonal BiFeO3 thin films
- The Magnetoelastic Distortion of Multiferroic BiFeO in the Canted Antiferromagnetic State
- Patterning enhanced tetragonality in BiFeO3 thin films with effective negative pressure by helium implantation
- Structural behaviour of BiFeO3/SrRuO3 superlattices: an X-ray diffraction and Raman spectroscopy investigation
- Built-in electric field induces polarization rotation in bilayer BiFeO3/(Ba,Sr)TiO3 thin films