Electric field effect on BiFeO single crystal investigated by Raman spectroscopy
arXiv:0710.5412 · doi:10.1063/1.2771380
Abstract
Micro-Raman spectroscopy has been used to study lattice dynamics associated with the ferroelectric domains of a BiFeO single crystal at low temperature. The phonon assignment shows a large frequency splitting between the transverse and longitudinal components of the A phonon mode related to the Bi-O bonds in contrast with thin films where the splitting is negligible. Applying an external electric field induces frequency shifts of the low energy modes related to the Bi-O bonds. These softenings are due to a tensile stress via the piezoelectric effect. We give estimates of the phonon deformation potentials.
arXiv comment10 pages, 2 figures
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- Phase transition close to room temperature in BiFeO3 thin films
- Phase transitions and ferroelectrics: revival and the future in the field
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- Temperature evolution of the band-gap in BiFeO3 traced by resonant Raman scattering
- Patterning enhanced tetragonality in BiFeO3 thin films with effective negative pressure by helium implantation
- Structural investigation of (111) oriented (BiFeO3)(1-x)Λ/(LaFeO3)xΛ superlattices by X-ray diffraction and Raman spectroscopy