A tool to estimate the critical dynamics and thickness of superconducting films and interfaces

Abstract

We demonstrate that the magnetic field dependence of the conductivity measured at the transition temperature allows the dynamical critical exponent, the thickness of thin superconducting films and interfaces, and the limiting lateral length to be determined. The resulting tool is applied to the conductivity data of an amorphous Nb0.15 Si0.85 film and a LaAlO3/SrTiO3 interface.

6 pages, 6 figures

References in corpus (3)

• Electric Field Control of the LaAlO${}_3$/SrTiO${}_3$ Interface Ground State
• Towards two-dimensional metallic behavior at LaAlO3/SrTiO3 interfaces
• Spin effects in single electron tunneling

Cited by in corpus (4)

• Dynamical response and confinement of the electrons at the LaAlO3/SrTiO3 interface
• Suppression of the Berezinskii-Kosterlitz-Thouless and Quantum Phase Transitions in 2D Superconductors by Finite Size Effects
• Diamagnetism, Nernst signal, and finite size effects in superconductors above the transition temperature
• Quantum superconductor-insulator transition: Implications of BKT-critical behavior