Depth Resolution of Piezoresponse Force Microscopy
arXiv:0905.2209 · doi:10.1063/1.3126490
Abstract
Given that a ferroelectric domain is generally a three dimensional entity, the determination of its area as well as its depth is mandatory for full characterization. Piezoresponse force microscopy (PFM) is known for its ability to map the lateral dimensions of ferroelectric domains with high accuracy. However, no depth profile information has been readily available so far. Here, we have used ferroelectric domains of known depth profile to determine the dependence of the PFM response on the depth of the domain, and thus effectively the depth resolution of PFM detection.
8 pages, 5 figure
References in corpus (4)
- Quantitative analysis of ferroelectric domain imaging with piezoresponse force microscopy
- Surface domain engineering in congruent lithium niobate single crystals: A route to submicron periodic poling
- Contrast Mechanisms for the Detection of Ferroelectric Domains with Scanning Force Microscopy
- Impact of the tip radius on the lateral resolution in piezoresponse force microscopy