56 citations · 244 across the 6 of their papers we have counts for
7 papers
Contrast Mechanisms for the Detection of Ferroelectric Domains with Scanning Force Microscopy
T. Jungk, A. Hoffmann, E. Soergel
We present a full analysis of the contrast mechanisms for the detection of ferroelectric domains on all faces of bulk single crystals using scanning force microscopy exemplified on…
Impact of the tip radius on the lateral resolution in piezoresponse force microscopy
T. Jungk, A. Hoffmann, E. Soergel
We present a quantitative investigation of the impact of tip radius as well as sample type and thickness on the lateral resolution in piezoresponse force microscopy (PFM) investiga…
Limitations for the determination of piezoelectric constants with piezoresponse force microscopy
T. Jungk, A. Hoffmann., E. Soergel
At first sight piezoresponse force microscopy (PFM) seems an ideal technique for the determination of piezoelectric coefficients (PCs), thus making use of its ultra-high vertical r…
Crosstalk Correction in Atomic Force Microscopy
A. Hoffmann, T. Jungk, E. Soergel
Commercial atomic force microscopes usually use a four-segmented photodiode to detect the motion of the cantilever via laser beam deflection. This read-out technique enables to mea…
Detection mechanism for ferroelectric domain boundaries with lateral force microscopy
T. Jungk, A. Hoffmann, E. Soergel
The contrast mechanism for the visualization of ferroelectric domain boundaries with lateral force microscopy is generally assumed to be caused by mechanical deformation of the sam…
Impact of elasticity on the piezoresponse of adjacent ferroelectric domains investigated by scanning force microscopy
Tobias Jungk, Akos Hoffmann, Elisabeth Soergel
As a consequence of elasticity, mechanical deformations of crystals occur on a length scale comparable to their thickness. This is exemplified by applying a homogeneous electric fi…