activity
20052008
most citedLimitations for the determination of piezoelectric constants with piezoresponse force microscopy

56 citations · 258 across the 7 of their papers we have counts for

collaborators

8 papers

cond-mat.mtrl-sci200847 cited

Contrast Mechanisms for the Detection of Ferroelectric Domains with Scanning Force Microscopy

T. Jungk, A. Hoffmann, E. Soergel

We present a full analysis of the contrast mechanisms for the detection of ferroelectric domains on all faces of bulk single crystals using scanning force microscopy exemplified on…

cond-mat.mtrl-sci200739 cited

Impact of the tip radius on the lateral resolution in piezoresponse force microscopy

T. Jungk, A. Hoffmann, E. Soergel

We present a quantitative investigation of the impact of tip radius as well as sample type and thickness on the lateral resolution in piezoresponse force microscopy (PFM) investiga…

cond-mat.mtrl-sci200756 cited

Limitations for the determination of piezoelectric constants with piezoresponse force microscopy

T. Jungk, A. Hoffmann., E. Soergel

At first sight piezoresponse force microscopy (PFM) seems an ideal technique for the determination of piezoelectric coefficients (PCs), thus making use of its ultra-high vertical r…

physics.optics200614 cited

A stochastical model for periodic domain structuring in ferroelectric crystals

Felix Kalkum, Helge A. Eggert, Tobias Jungk +1

A stochastical description is applied in order to understand how ferroelectric structures can be formed. The predictions are compared with experimental data of the so-called electr…

cond-mat.mtrl-sci200648 cited

Crosstalk Correction in Atomic Force Microscopy

A. Hoffmann, T. Jungk, E. Soergel

Commercial atomic force microscopes usually use a four-segmented photodiode to detect the motion of the cantilever via laser beam deflection. This read-out technique enables to mea…

cond-mat.mtrl-sci200636 cited

Detection mechanism for ferroelectric domain boundaries with lateral force microscopy

T. Jungk, A. Hoffmann, E. Soergel

The contrast mechanism for the visualization of ferroelectric domain boundaries with lateral force microscopy is generally assumed to be caused by mechanical deformation of the sam…