Randomized benchmarking and process tomography for gate errors in a solid-state qubit

Abstract

We present measurements of single-qubit gate errors for a superconducting qubit. Results from quantum process tomography and randomized benchmarking are compared with gate errors obtained from a double pi pulse experiment. Randomized benchmarking reveals a minimum average gate error of 1.1+/-0.3% and a simple exponential dependence of fidelity on the number of gates. It shows that the limits on gate fidelity are primarily imposed by qubit decoherence, in agreement with theory.

4 pages, 4 figures, plus supplementary material

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Cited by in corpus (31)

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• High-Fidelity Readout in Circuit Quantum Electrodynamics Using the Jaynes-Cummings Nonlinearity
• Fast Reset and Suppressing Spontaneous Emission of a Superconducting Qubit
• Analytic control methods for high fidelity unitary operations in a weakly nonlinear oscillator
• Digital quantum simulation of spin models with circuit quantum electrodynamics
• Process verification of two-qubit quantum gates by randomized benchmarking
• Control and Tomography of a Three Level Superconducting Artificial Atom
• Microwave-driven coherent operations of a semiconductor quantum dot charge qubit
• Quantifying the quantum gate fidelity of single-atom spin qubits in silicon by randomized benchmarking
• Randomized Benchmarking of Multi-Qubit Gates
• Life after charge noise: recent results with transmon qubits
• Quantum process tomography of unitary and near-unitary maps
• Dynamics of dispersive single qubit read-out in circuit quantum electrodynamics
• Spin dynamics in a strongly driven system: very slow Rabi oscillations
• Compressed sensing quantum process tomography for superconducting quantum gates
• Experimental Estimation of Average Fidelity of a Clifford Gate on a 7-qubit Quantum Processor
• Randomized benchmarking of atomic qubits in an optical lattice
• Dispersive Qubit Measurement by Interferometry with Parametric Amplifiers
• Accelerated Randomized Benchmarking
• Robust and efficient in situ quantum control
• Optimal control for fast and high-fidelity quantum gates in coupled superconducting flux qubits
• Progress toward scalable tomography of quantum maps using twirling-based methods and information hierarchies
• Single-Shot Quantum Process Tomography
• Quantum Model Averaging
• Time-optimal performance of Josephson charge qubits: A process tomography approach
• Decay of nonlocality due to adiabatic and quantum noise in the solid state
• Accurate Qubit Control with Single Flux Quantum Pulses