Scaling behaviors of RESET voltages and currents in unipolar resistance switching

Abstract

Unipolar switching phenomena have attracted a great deal of recent attention, but the wide distributions of switching voltages still pose major obstacles for scientific advancement and practical applications. Using NiO capacitors, we investigated the distributions of the RESET voltage and current. We found that they scaled with the resistance value Ro in the low resistance state, and that the scaling exponents varied at Ro = 30 Ohm. We explain these intriguing scaling behaviors and their crossovers by analogy with percolation theory. We show that the connectivity of conducting filaments plays a crucial role in the RESET process.

arXiv comment17 pages, 4 figures

References in corpus (2)

• Percolation Model Explaining Both Unipolar Memory and Threshold Resistance Switchings in NiO Film
• Effects of heat dissipation on unipolar resistance switching in Pt/NiO/Pt capacitors

Cited by in corpus (4)

• Large 1/f noise of unipolar resistance switching and its percolating nature
• Predictability of reset switching voltages in unipolar resistance switching
• Reduction of high reset currents in unipolar resistance switching Pt/SrTiOx/Pt capacitors using acceptor doping
• Cyclic electric field stress on bipolar resistive switching devices