Search for EC and ECEC processes in Sn and decay of Sn to the excited states of Te
arXiv:0804.3849 · doi:10.1016/j.nuclphysa.2008.04.009
Abstract
Limits on EC and ECEC processes in Sn and on decay of Sn to the excited states of Te have been obtained using a 380 cm HPGe detector and an external source consisting of natural tin. A limit with 90% C.L. on the Sn half-life of y for the ECEC(0) transition to the excited state in Cd (1871.0 keV) has been established. This transition is discussed in the context of a possible enhancement of the decay rate by several orders of magnitude given that the ECEC process is nearly degenerate with an excited state in the daughter nuclide. Prospects for investigating such a process in future experiments are discussed. The decay limits for Sn to the excited states of Te were obtained on the level of y at the 90% C.L.
17 pages, 5 figures
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