X-ray Irradiation-induced Carrier Doping Effects in Organic Dimer-Mott Insulators
arXiv:0710.3005 · doi:10.1143/JPSJ.76.123701
Abstract
We report X-ray irradiation-induced carrier doping effects on the electrical conductivity in the organic dimer-Mott insulators -(ET) with Cu[N(CN)]Cl and Cu(CN). For -(ET)Cu[N(CN)]Cl, we have observed a large decrease of the resistivity by 40 % with the irradiation at 300 K and the metal-like temperature dependence down to about 50 K. The irradiation-induced defects expected at the donor molecule sites might cause a local imbalance of the charge transfer in the crystal. Such molecular defects result in the effective doping of carriers into the half-filled dimer-Mott insulators.
4 pages, 3 figures