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IBM Research - Thomas J. Watson Research Center

United States

74 papers here13.8k citations across 74
fields
  • quant-ph25
  • cond-mat.mes-hall21
  • cond-mat.mtrl-sci6
  • cs.IT3
  • astro-ph.CO2
  • cond-mat.str-el2
  • cond-mat.supr-con2
  • math.OC2
ROR 0265w5591OpenAlex

affiliations via OpenAlex

output
20022013
most citedGraphene photodetectors for high-speed optical communications

2.5k citations

researchers with a paper here
  • J. Smolin11 · h 59
  • Graeme Smith2 profiles10 · h 35
  • P. Avouris10 · h 127
  • Phaedon Avouris7
  • V. Perebeinos7 · h 48
  • Jay Gambetta6
  • D. DiVincenzo4 · h 70
  • Fengnian Xia4
  • Hugen Yan2 profiles4 · h 45
  • Marcus Freitag4
  • Matthias Steffen2 profiles4 · h 3
  • M. Steiner2 profiles4 · h 28
collaborating institutions
  • IBM (United States)US24 papers
  • California Institute of TechnologyUS6 papers
  • Massachusetts Institute of TechnologyUS5 papers
  • Cornell UniversityUS4 papers
  • Université de SherbrookeCA3 papers
  • University of WaterlooCA3 papers
  • ETH ZurichCH2 papers
  • Instituto de Ciencia de Materiales de MadridES2 papers
  • Lawrence Berkeley National LaboratoryUS2 papers
  • Los Alamos National LaboratoryUS2 papers
  • National High Magnetic Field LaboratoryUS2 papers
  • National Institute of Standards and TechnologyUS2 papers
Showing 2011Show all

1 paper · 1 filter

cond-mat.mtrl-sci2011★ 3 cited

Medium Energy Ion Scattering of Gr on SiC(0001) and Si(100)

M. Copel, S. Oida, A. Kasry +3

Depth profiling of graphene with high-resolution ion beam analysis is a practical method for analysis of monolayer thicknesses of graphene. Not only is the energy resolution suffic…

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