23 citations
- Nantes UniversitéFR7 papers
- Institut d'Électronique et des Technologies du numéRiqueFR2 papers
- Centre de Recherche en InformatiqueFR1 paper
- Centre de Recherche en Informatique, Signal et Automatique de LilleFR1 paper
- Centre de Recherche sur les Ions, les Matériaux et la PhotoniqueFR1 paper
- Centre National de la Recherche ScientifiqueFR1 paper
- École Nationale Supérieure d'Ingénieurs de CaenFR1 paper
- Informatique, BioInformatique, Systèmes ComplexesFR1 paper
- Institut de Recherche en Génie Civil et MécaniqueFR1 paper
- Laboratoire de Physique Corpusculaire de CaenFR1 paper
- Université de LilleFR1 paper
- Université de NantesFR1 paper
8 papers
Benchmarking multi-component signal processing methods in the time-frequency plane
Juan M. Miramont, Rémi Bardenet, Pierre Chainais +1
Signal processing in the time-frequency plane has a long history and remains a field of methodological innovation. For instance, detection and denoising based on the zeros of the s…
A Pseudo-labelling Auto-Encoder for unsupervised image classification
Aymene Mohammed Bouayed, Karim Atif, Rachid Deriche +1
In this paper, we introduce a unique variant of the denoising Auto-Encoder and combine it with the perceptual loss to classify images in an unsupervised manner. The proposed method…
Second-order Time-Reassigned Synchrosqueezing Transform: Application to Draupner Wave Analysis
Dominique Fourer, François Auger
This paper addresses the problem of efficiently jointly representing a non-stationary multicomponent signal in time and frequency. We introduce a novel enhancement of the time-reas…
Optical properties of PZT thin films deposited on a ZnO buffer layer
T Schneider, D Leduc, J. Cardin +3
The optical properties of lead zirconate titanate (PZT) thin films deposited on ZnO were studied by m-lines spectroscopy. In order to retrieve the refractive index and the thicknes…
A method to retrieve optical and geometrical characteristics of three layer waveguides from m-lines measurements
Thomas Schneider, Dominique Leduc, Cyril Lupi +3
We consider three layer optical waveguides and present a method to measure simultaneously the refractive index and the thickness of each layer with m-lines spectroscopy. We establi…
Optical characterization of PZT thin films for waveguide applications
Julien Cardin, Dominique Leduc, Thomas Schneider +3
In order to develop an electro-optic waveguide, Pb(Zr, Ti)O3 ceramic ferroelectric thin films were elaborated by a modified sol-gel process on glass substrate. In the aim to study…