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20062025
most citedReduced lasing thresholds in GeSn microdisk cavities with defect management of the optically active region

65 citations

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Showing 2008 · cond-mat.mtrl-sciShow all

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cond-mat.mtrl-sci2008★ 33 cited

Quantification of the bond-angle dispersion by Raman spectroscopy and the strain energy of amorphous silicon

P. Roura, J. Farjas, P. Roca i Cabarrocas

A thorough critical analysis of the theoretical relationships between the bond-angle dispersion in a-Si and the width of the transverse optical (TO) Raman peak is presented. It is…