activity
20122018
most citedApplication of Spectroscopic Ellipsometry and Mueller Ellipsometry to Optical Characterization

117 citations · 212 across the 5 of their papers we have counts for

collaborators

5 papers

physics.optics2018★ 22 cited

A Stern-Gerlach experiment with light: separating photons by spin with the method of A. Fresnel

Oriol Arteaga, Enric Garcia-Caurel, Razvigor Ossikovski

In 1822 A. Fresnel described an experiment to separate a beam of light into its right- and left- circular polarization components using chiral interfaces. Fresnel's experiment comb…

physics.optics2018★ 4 cited

Experimental studies of the transmission of light through low coverage regular or random arrays of silica micropillars supported by a glass substrate

Colette Turbil, Thomas Sang HyukYoo, Ingve Simonsen +3

The transmission of light through low coverage regular and random arrays of glass supported silica micropillars of diameters 10 to 40 \micro\meter and height 10 \micro\meter is stu…

physics.optics2015★ 18 cited

A mid-infrared Mueller ellipsometer with pseudo-achromatic optical elements

E. Garcia-Caurel, A. Lizana, G. Ndong +5

The purpose of this article is to present a new broadband Mueller ellipsometer designed to work in the mid-infrared range, from 3 to 14 microns. The Mueller ellipsometer, which can…

physics.optics2012★ 117 cited

Application of Spectroscopic Ellipsometry and Mueller Ellipsometry to Optical Characterization

Enric Garcia-Caurel, Antonello De Martino, Jean-Paul Gaston +1

This article aims to provide a brief overview of both established and novel ellipsometry techniques, as well as their applications. Ellipsometry is an indirect optical technique in…

cond-mat.mtrl-sci2012★ 51 cited

Effect of the anodization voltage on the porewidening rate of nanoporous anodic alumina

Mohammad Mahbubur Rahman, Enric Garcia-Caurel, Abel Santos +3

A detailed study of the pore-widening rate of nanoporous anodic alumina layers as a function of the anodization voltage was carried out. The study focuses on samples produced under…