most citedQuantification of the bond-angle dispersion by Raman spectroscopy and the strain energy of amorphous silicon

33 citations · 33 across the 4 of their papers we have counts for

collaborators

4 papers

cond-mat.mtrl-sci200833 cited

Quantification of the bond-angle dispersion by Raman spectroscopy and the strain energy of amorphous silicon

P. Roura, J. Farjas, P. Roca i Cabarrocas

A thorough critical analysis of the theoretical relationships between the bond-angle dispersion in a-Si and the width of the transverse optical (TO) Raman peak is presented. It is…

cond-mat.mtrl-sci2007

Determination of localized conduction band-tail states distribution in single phase undoped microcrystalline silicon

Sanjay K. Ram, Satyendra Kumar, P. Roca i Cabarrocas

We report on the phototransport properties of microstructurally well characterized plasma deposited highly crystallized microcrystalline silicon films. The steady state photoconduc…

cond-mat.mtrl-sci2007

Elucidation of microstructure of single-phase microcrystalline silicon based on crystallite size distributions

Sanjay K. Ram, MD. N. Islam, P. Roca I Cabarrocas +1

Highly crystallized undoped hydrogenated microcrystalline silicon films prepared using SiF4-H2 mixture plasma were investigated at various stages of growth employing different micr…

cond-mat.mtrl-sci2007

Influence of fractional composition of crystallite grains on the dark conductivity in fully crystallized undoped microcrystalline silicon

Sanjay K. Ram, Satyendra Kumar, P. Roca i Cabarrocas

Improvement in film growth technology requires a knowledge of the correlation between microstructural and deposition parameters with electrical properties in hydrogenated microcrys…