301 citations
- ETH ZurichCH7 papers
- Paul Scherrer InstituteCH3 papers
- Swiss Light Source3 papers
- Centre National de la Recherche ScientifiqueFR2 papers
- Freie Universität BerlinDE2 papers
- IBM (United States)US2 papers
- Atlanta Technical CollegeUS1 paper
- Chalmers University of TechnologySE1 paper
- Elettra-Sincrotrone Trieste S.C.p.A.IT1 paper
- Georgia Institute of TechnologyUS1 paper
- Institute for Cross-Disciplinary Physics and Complex SystemsES1 paper
- Institut NéelFR1 paper
Showing physics.gen-phShow all
2 papers · 1 filter
physics.gen-ph2008
High Performance Thermal Interface Technology Overview
R. Linderman, T. Brunschwiler, B. Smith +1
An overview on recent developments in thermal interfaces is given with a focus on a novel thermal interface technology that allows the formation of 2-3 times thinner bondlines with…
physics.gen-ph2008
Utility of transient testing to characterize thermal interface materials
B. Smith, T. Brunschwiler, B. Michel
This paper analyzes a transient method for the characterization of low-resistance thermal interfaces of microelectronic packages. The transient method can yield additional informat…