activity
20032017
most citedSnell's law for surface electrons: Refraction of an electron gas imaged in real space

167 citations · 472 across the 9 of their papers we have counts for

collaborators

9 papers

cond-mat.mtrl-sci2017★ 1 cited

Passivation of dangling bonds on hydrogenated Si(100)-21: a possible method for error correction in hydrogen lithography

Niko Pavliček, Zsolt Majzik, Gerhard Meyer +1

Using combined low temperature scanning tunneling microscopy (STM) and atomic force microscopy (AFM), we demonstrate hydrogen passivation of individual, selected dangling bonds (DB…

cond-mat.mtrl-sci2017★ 15 cited

Atomic and Electronic Structure of Si Dangling Bonds in Quasi-Free-Standing Monolayer Graphene

Yuya Murata, Tommaso Cavallucci, Valentina Tozzini +7

Si dangling bonds without H termination at the interface of quasi-free standing monolayer graphene (QFMLG) are known scattering centers that can severely affect carrier mobility. I…

cond-mat.mes-hall2017★ 5 cited

Interactions between two C60 molecules measured by scanning probe microscopies

Nadine Hauptmann, César González, Fabian Mohn +3

C60-functionalized tips are used to probe C60 molecules on Cu(111) with scanning tunneling and atomic force microscopy. Distinct and complex intramolecular contrasts are found. Max…

cond-mat.mes-hall2015★ 20 cited

Effect of electron-phonon interaction on the formation of one-dimensional electronic states in coupled Cl vacancies

Bruno Schuler, Mats Persson, Sami Paavilainen +4

The formation of extended electron states in one-dimensional nanostructures is of key importance for the function of molecular electronics devices. Here we study the effects of str…

cond-mat.mes-hall2014★ 68 cited

Investigating Atomic Contrast in Atomic Force Microscopy and Kelvin Probe Force Microscopy on Ionic Systems using Functionalized Tips

Leo Gross, Bruno Schuler, Fabian Mohn +7

Noncontact atomic force microscopy (NC-AFM) and Kelvin probe force microscopy (KPFM) have become important tools for nanotechnology; however, their contrast mechanisms on the atomi…

cond-mat.mes-hall2012★ 51 cited

Force and Conductance during contact formation to a C60 molecule

Nadine Hauptmann, Fabian Mohn, Leo Gross +3

Force and conductance were simultaneously measured during the formation of Cu-C60 and C60-C60 contacts using a combined cryogenic scanning tunneling and atomic force microscope. Th…