output
19972026
most citedThe Photodetector Array Camera and Spectrometer (PACS) on the Herschel Space Observatory

2.2k citations

Showing 2023Show all

35 papers · 1 filter

eess.SY2023★ 8 cited

CSI Measurements and Initial Results for Massive MIMO to UAV Communication

Zhuangzhuang Cui, Achiel Colpaert, Sofie Pollin

Non-Terrestrial Network (NTN) has been envisioned as a key component of the sixth-generation (6G) mobile communication system. Meanwhile, unmanned aerial vehicles (UAVs) play an im…

cond-mat.mtrl-sci2023★ 11 cited

Reduction of Magnetic Interaction Due to Clustering in Doped Transition-Metal Dichalcogenides: A Case Study of Mn, V, Fe-Doped

Sabyasachi Tiwari, Maarten Van de Put, Bart Soree +2

Using Hubbard U corrected density functional theory calculations, lattice Monte-Carlo, and spin-Monte-Carlo simulations, we investigate the impact of dopant clustering on the magne…

quant-ph2023★ 13 cited

Bistability-assisted Mechanical Squeezing and Entanglement

Souvik Agasti, P. Djorwé

We propose a scheme to squeeze mechanical motion and to entangle optical field with mechanical motion in an optomechanical system containing a parametric amplification. The scheme…

cond-mat.mtrl-sci2023

Confinement-Induced Isosymmetric Metal-Insulator Transition in Ultrathin Epitaxial V2O3 Films

Simon Mellaerts, Claudio Bellani, Wei-Fan Hsu +9

Dimensional confinement has shown to be an effective strategy to tune competing degrees of freedom in complex oxides. Here, we achieved atomic layered growth of trigonal vanadium s…

physics.optics2023★ 55 cited

Micro-transfer-printed Thin film lithium niobate (TFLN)-on-Silicon Ring Modulator

Ying Tan, Shengpu Niu, Maximilien Billet +7

Thin-film lithium niobate (TFLN) has a proven record of building high-performance electro-optical (EO) modulators. However, its CMOS incompatibility and the need for non-standard e…

cs.CV2023★ 1 cited

Benchmarking Feature Extractors for Reinforcement Learning-Based Semiconductor Defect Localization

Enrique Dehaerne, Bappaditya Dey, Sandip Halder +1

As semiconductor patterning dimensions shrink, more advanced Scanning Electron Microscopy (SEM) image-based defect inspection techniques are needed. Recently, many Machine Learning…