22 citations
- Shanghai Institute of Microsystem and Information TechnologyCN5 papers
- Chinese Academy of SciencesCN4 papers
- Stanford UniversityUS3 papers
- ShanghaiTech UniversityCN2 papers
- Collaborative Innovation Center of Advanced MicrostructuresCN1 paper
- Energy FoundationCN1 paper
- Friedrich Schiller University JenaDE1 paper
- High Magnetic Field LaboratoryCN1 paper
- Nano and Advanced Materials InstituteCN1 paper
- Photonic Systems (United States)US1 paper
- RIKEN Center for Emergent Matter ScienceJP1 paper
- Ruijin HospitalCN1 paper
6 papers
Scalable Miniature On-chip Fourier Transform Spectrometer For Raman Spectroscopy
Sarp Kerman, Xiao Luo, Zuoqin Ding +6
Miniaturized spectrometers for Raman spectroscopy have the potential to open up a new chapter in sensing. Raman spectroscopy is essential for material characterization and biomedic…
Fast Extrinsic Calibration for Multiple Inertial Measurement Units in Visual-Inertial System
Youwei Yu, Yanqing Liu, Fengjie Fu +5
In this paper, we propose a fast extrinsic calibration method for fusing multiple inertial measurement units (MIMU) to improve visual-inertial odometry (VIO) localization accuracy.…
Deep levels analysis in wavelength extended InGaAsBi photodetector
Jian Huang, Baile Chen, Zhuo Deng +5
InP based dilute Bismide InGaAsBi material is emerging as a promising candidate for extending short wavelength infrared detection. One critical factor to limit the performance of t…
Direct Imaging of Dynamic Glassy Behavior in a Strained Manganite Film
Worasom Kundhikanjana, Zhigao Sheng, Yongliang Yang +10
Complex many-body interaction in perovskite manganites gives rise to a strong competition between ferromagnetic metallic and charge ordered phases with nanoscale electronic inhomog…
Batch-fabricated cantilever probes with electrical shielding for nanoscale dielectric and conductivity imaging
Yongliang Yang, Keji Lai, Qiaochu Tang +5
This paper presents the design and fabrication of batch-processed cantilever probes with electrical shielding for scanning microwave impedance microscopy. The diameter of the tip a…
Unexpected Surface Implanted Layer in Static Random Access Memory Devices Observed by Microwave Impedance Microscope
Worasom Kundhikanjana, Yongliang Yang, Qiaochu Tang +5
Real-space mapping of doping concentration in semiconductor devices is of great importance for the microelectronic industry. In this work, a scanning microwave impedance microscope…