146 citations
- Carnegie Mellon UniversityUS3 papers
- The University of Texas at AustinUS3 papers
- Data61AU2 papers
- Georgia Institute of TechnologyUS2 papers
- National Chung Hsing UniversityTW2 papers
- Stanford UniversityUS2 papers
- The University of MelbourneAU2 papers
- University of California San DiegoUS2 papers
- Advanced Micro Devices (United States)US1 paper
- ARC Centre of Excellence for All-sky AstrophysicsAU1 paper
- ARC Centre of Excellence for Gravitational Wave DiscoveryAU1 paper
- Astronomy and SpaceAU1 paper
Showing 2014Show all
3 papers · 1 filter
cs.AR2014★ 93 cited
Layout decomposition for triple patterning lithography
Bei Yu, Kun Yuan, Boyang Zhang +2
As minimum feature size and pitch spacing further decrease, triple patterning lithography (TPL) is a possible 193nm extension along the paradigm of double patterning lithography (D…
cs.AR2014★ 2 cited
E-BLOW: E-Beam Lithography Overlapping aware Stencil Planning for MCC System
Bei Yu, Kun Yuan, Jhih-Rong Gao +1
Electron beam lithography (EBL) is a promising maskless solution for the technology beyond 14nm logic node. To overcome its throughput limitation, recently the traditional EBL syst…
cs.AI2014★ 15 cited
Fast Set Bounds Propagation Using a BDD-SAT Hybrid
Graeme Gange, Peter James Stuckey, Vitaly Lagoon
Binary Decision Diagram (BDD) based set bounds propagation is a powerful approach to solving set-constraint satisfaction problems. However, prior BDD based techniques in- cur the s…