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Nikon (United States)

United States

1 paper here8 citations across 1
fields
  • physics.optics1
ROR 0280y9h11OpenAlex

affiliations via OpenAlex

most citedReduced basis method for source mask optimization

8 citations

researchers with a paper here
  • D. Flagello1
  • F. Schmidt1 · h 26
  • J. Pomplun1 · h 14
  • J. Tyminski1
  • L. Zschiedrich1 · h 23
  • Nakashima Toshiharu1
  • S. Burger1 · h 36
collaborating institutions
  • EdgeWave (Germany)DE1 paper
  • Nikon (Japan)JP1 paper
  • Zuse Institute BerlinDE1 paper

1 paper

physics.optics2010★ 8 cited

Reduced basis method for source mask optimization

J. Pomplun, L. Zschiedrich, S. Burger +4

Image modeling and simulation are critical to extending the limits of leading edge lithography technologies used for IC making. Simultaneous source mask optimization (SMO) has beco…

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