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20102015
most citedAdsorption of Sugars on Al- and Ga-doped Boron Nitride Surfaces: A Computational Study

45 citations

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cond-mat.mtrl-sci2011★ 3 cited

Medium Energy Ion Scattering of Gr on SiC(0001) and Si(100)

M. Copel, S. Oida, A. Kasry +3

Depth profiling of graphene with high-resolution ion beam analysis is a practical method for analysis of monolayer thicknesses of graphene. Not only is the energy resolution suffic…