172 citations
- Purdue University West LafayetteUS2 papers
- University of Tennessee at KnoxvilleUS2 papers
- Case Western Reserve UniversityUS1 paper
- Hasbro (United States)US1 paper
- Hollister (United States)US1 paper
- Indian Institute of Science BangaloreIN1 paper
- Knoxville CollegeUS1 paper
- MKS Instruments (Japan)JP1 paper
- National Cheng Kung UniversityTW1 paper
- Oak Ridge National LaboratoryUS1 paper
- Oxford Instruments (Germany)DE1 paper
- Pacific Northwest National LaboratoryUS1 paper
10 papers
Spin Vector Control for Heisenberg-Inspired Probabilistic Computing
Yuanqiu Tan, Rahul Tripathi, Saleh Bunaiyan +5
Probabilistic bits (p-bits) have emerged as a cornerstone of probabilistic computing, enabling energy-efficient hardware implementation for probabilistic inference and combinatoria…
Integration of Scanning Probe Microscope with High-Performance Computing: fixed-policy and reward-driven workflows implementation
Yu Liu, Utkarsh Pratiush, Jason Bemis +8
The rapid development of computation power and machine learning algorithms has paved the way for automating scientific discovery with a scanning probe microscope (SPM). The key ele…
Nanoscale rheology: Dynamic Mechanical Analysis over a broad and continuous frequency range using Photothermal Actuation Atomic Force Microscopy
Alba R. Piacenti, Casey Adam, Nicholas Hawkins +5
Polymeric materials are widely used in industries ranging from automotive to biomedical. Their mechanical properties play a crucial role in their application and function and arise…
Scalable synthesis and characterization of multilayer -graphyne, new carbon crystals with a small direct bandgap
Victor G. Desyatkin, William B. Martin, Ali E. Aliev +12
-Graphyne is the most symmetric sp2/sp1 allotrope of carbon, which can be viewed as graphene uniformly expanded through insertion of two-carbon acetylenic units between all the…
Quantitative Electromechanical Atomic Force Microscopy
Liam Collins, Yongtao Liu, Olga Ovchinnikova +1
The ability to probe a materials electromechanical functionality on the nanoscale is critical to applications from energy storage and computing to biology and medicine. Voltage mod…
Fast, High Resolution and Wide Modulus Range Nanomechanical Mapping with Bimodal Tapping Mode
Marta Kocun, Aleksander Labuda, Waiman Meinhold +2
Tapping mode atomic force microscopy (AFM), also known as amplitude modulated (AM) or AC mode, is a proven, reliable and gentle imaging mode with widespread applications. Over the…