51 citations · 53 across the 5 of their papers we have counts for
5 papers
Robust and Efficient Parametric Spectral Estimation in Atomic Force Microscopy
Bryan Yates, Aleksander Labuda, Martin Lysy
An atomic force microscope (AFM) is capable of producing ultra-high resolution measurements of nanoscopic objects and forces. It is an indispensable tool for various scientific dis…
Fast, High Resolution and Wide Modulus Range Nanomechanical Mapping with Bimodal Tapping Mode
Marta Kocun, Aleksander Labuda, Waiman Meinhold +2
Tapping mode atomic force microscopy (AFM), also known as amplitude modulated (AM) or AC mode, is a proven, reliable and gentle imaging mode with widespread applications. Over the…
Calibration of higher eigenmodes of cantilevers
Aleksander Labuda, Marta Kocun, Tim Walsh +5
A method is presented for calibrating the higher eigenmodes (resonance modes) of atomic force microscopy cantilevers that can be performed prior to any tip-sample interaction. The…
Quantitative Measurements of Electromechanical Response with a Metrological Atomic Force Microscope
Aleks Labuda, Roger Proksch
An ongoing challenge in atomic force microscope (AFM) experiments is the quantitative measurement of cantilever motion. The vast majority of AFMs use the optical beam deflection (O…
Photothermally Excited Contact Resonance Imaging in Air and Water
Marta Kocun, Aleksander Labuda, Anil Gannepalli +1
Contact Resonance Force Microscopy (CR-FM) is a leading AFM technique for measuring viscoelastic nano-mechanical properties. Conventional piezo-excited CR-FM measurements have been…