55 citations · 141 across the 10 of their papers we have counts for
10 papers
Burton-Cabrera-Frank theory for surfaces with alternating step types
Guangxu Ju, Dongwei Xu, Carol Thompson +5
Burton-Cabrera-Frank (BCF) theory has proven to be a versatile framework to relate surface morphology and dynamics during crystal growth to the underlying mechanisms of adatom diff…
Crystal Truncation Rods from Miscut Surfaces with Alternating Terminations
Guangxu Ju, Dongwei Xu, Carol Thompson +5
Miscut surfaces of layered crystals can exhibit a stair-like sequence of terraces having periodic variation in their atomic structure. For hexagonal close-packed and related crysta…
Dynamics of Atomic Steps on GaN (0001) during Vapor Phase Epitaxy
Guangxu Ju, Dongwei Xu, Carol Thompson +5
Images of the morphology of GaN (0001) surfaces often show half-unit-cell-height steps separating a sequence of terraces having alternating large and small widths. This can be expl…
In Situ Microbeam Surface X-ray Scattering Reveals Alternating Step Kinetics During Crystal Growth
Guangxu Ju, Dongwei Xu, Carol Thompson +5
The stacking sequence of hexagonal close-packed and related crystals typically results in steps on vicinal {0001} surfaces that have alternating A and B structures with different g…
Optical and structural properties of Si doped -GaO (010) thin films homoepitaxially grown by halide vapor phase epitaxy
Bahadir Kucukgok, David J. Mandia, Jacob H. Leach +6
We report the optical, electrical, and structural properties of Si doped -GaO films grown on (010)-oriented -GaO substrate via HVPE. Our results show that, de…
Persistence of Island Arrangements During Layer-by-Layer Growth Revealed Using Coherent X-rays
Guangxu Ju, Dongwei Xu, Matthew J. Highland +7
Understanding surface dynamics during epitaxial film growth is key to growing high quality materials with controllable properties. X-ray photon correlation spectroscopy (XPCS) usin…
Characterization of the X-ray Coherence Properties of an Undulator Beamline at the Advanced Photon Source
Guangxu Ju, Matthew J. Highland, Carol Thompson +5
In anticipation of the increased use of coherent x-ray methods and the need to upgrade beamlines to match improved source quality, we have characterized the coherence properties of…
Real-time X-ray Monitoring of the Nucleation and Growth of AlN Epitaxial Films on Sapphire (0001)
Guangxu Ju, Matthew J. Highland, Jeffrey A. Eastman +4
We report the results of x-ray scattering studies of AlN on c-plane sapphire during reactive radiofrequency magnetron sputtering. The sensitivity of in situ x-ray measurements allo…
An instrument for advanced in situ x-ray studies of metal-organic vapor phase epitaxy of III-nitrides
Guangxu Ju, Matthew J. Highland, Angel Yanguas-Gil +6
We describe an instrument that exploits the ongoing revolution in synchrotron sources, optics, and detectors to enable in situ studies of metal-organic vapor phase epitaxy (MOVPE)…
Atomic layer engineering of perovskite oxides for chemically sharp heterointerfaces
Woo Seok Choi, Christopher M. Rouleau, Sung Seok A. Seo +10
Advances in synthesis techniques and materials understanding have given rise to oxide heterostructures with intriguing physical phenomena that cannot be found in their constituents…