52 citations · 165 across the 12 of their papers we have counts for
10 papers · 1 filter
Instrument for in situ hard x-ray nanobeam characterization during epitaxial crystallization and materials transformations
Samuel D. Marks, Peiyu Quan, Rui Liu +5
Solid-phase epitaxy (SPE) and other three-dimensional epitaxial crystallization processes pose challenging structural and chemical characterization problems. The concentration of d…
Burton-Cabrera-Frank theory for surfaces with alternating step types
Guangxu Ju, Dongwei Xu, Carol Thompson +5
Burton-Cabrera-Frank (BCF) theory has proven to be a versatile framework to relate surface morphology and dynamics during crystal growth to the underlying mechanisms of adatom diff…
Crystal Truncation Rods from Miscut Surfaces with Alternating Terminations
Guangxu Ju, Dongwei Xu, Carol Thompson +5
Miscut surfaces of layered crystals can exhibit a stair-like sequence of terraces having periodic variation in their atomic structure. For hexagonal close-packed and related crysta…
Dynamics of Atomic Steps on GaN (0001) during Vapor Phase Epitaxy
Guangxu Ju, Dongwei Xu, Carol Thompson +5
Images of the morphology of GaN (0001) surfaces often show half-unit-cell-height steps separating a sequence of terraces having alternating large and small widths. This can be expl…
In Situ Microbeam Surface X-ray Scattering Reveals Alternating Step Kinetics During Crystal Growth
Guangxu Ju, Dongwei Xu, Carol Thompson +5
The stacking sequence of hexagonal close-packed and related crystals typically results in steps on vicinal {0001} surfaces that have alternating A and B structures with different g…
High-energy coherent X-ray diffraction microscopy of polycrystal grains: first steps towards a multi-scale approach
Siddharth Maddali, Jun-Sang Park, Hemant Sharma +7
We present proof-of-concept imaging measurements of a polycrystalline material that integrate the elements of conventional high-energy X-ray diffraction microscopy with coherent di…
Persistence of Island Arrangements During Layer-by-Layer Growth Revealed Using Coherent X-rays
Guangxu Ju, Dongwei Xu, Matthew J. Highland +7
Understanding surface dynamics during epitaxial film growth is key to growing high quality materials with controllable properties. X-ray photon correlation spectroscopy (XPCS) usin…
Real-time X-ray Monitoring of the Nucleation and Growth of AlN Epitaxial Films on Sapphire (0001)
Guangxu Ju, Matthew J. Highland, Jeffrey A. Eastman +4
We report the results of x-ray scattering studies of AlN on c-plane sapphire during reactive radiofrequency magnetron sputtering. The sensitivity of in situ x-ray measurements allo…
Island dynamics and anisotropy during vapor phase epitaxy of m-plane GaN
Edith Perret, Dongwei Xu, M. J. Highland +5
Using in situ grazing-incidence x-ray scattering, we have measured the diffuse scattering from islands that form during layer-by-layer growth of GaN by metal-organic vapor phase ep…
An instrument for advanced in situ x-ray studies of metal-organic vapor phase epitaxy of III-nitrides
Guangxu Ju, Matthew J. Highland, Angel Yanguas-Gil +6
We describe an instrument that exploits the ongoing revolution in synchrotron sources, optics, and detectors to enable in situ studies of metal-organic vapor phase epitaxy (MOVPE)…