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cond-mat.mtrl-sci2020

Crystal Truncation Rods from Miscut Surfaces with Alternating Terminations

Guangxu Ju, Dongwei Xu, Carol Thompson +5

Miscut surfaces of layered crystals can exhibit a stair-like sequence of terraces having periodic variation in their atomic structure. For hexagonal close-packed and related crysta…

cond-mat.mtrl-sci2020

Dynamics of Atomic Steps on GaN (0001) during Vapor Phase Epitaxy

Guangxu Ju, Dongwei Xu, Carol Thompson +5

Images of the morphology of GaN (0001) surfaces often show half-unit-cell-height steps separating a sequence of terraces having alternating large and small widths. This can be expl…

cond-mat.mtrl-sci2020

In Situ Microbeam Surface X-ray Scattering Reveals Alternating Step Kinetics During Crystal Growth

Guangxu Ju, Dongwei Xu, Carol Thompson +5

The stacking sequence of hexagonal close-packed and related crystals typically results in steps on vicinal {0001} surfaces that have alternating A and B structures with different g…

cond-mat.mtrl-sci2019

High-energy coherent X-ray diffraction microscopy of polycrystal grains: first steps towards a multi-scale approach

Siddharth Maddali, Jun-Sang Park, Hemant Sharma +7

We present proof-of-concept imaging measurements of a polycrystalline material that integrate the elements of conventional high-energy X-ray diffraction microscopy with coherent di…

cond-mat.mtrl-sci2018

Persistence of Island Arrangements During Layer-by-Layer Growth Revealed Using Coherent X-rays

Guangxu Ju, Dongwei Xu, Matthew J. Highland +7

Understanding surface dynamics during epitaxial film growth is key to growing high quality materials with controllable properties. X-ray photon correlation spectroscopy (XPCS) usin…

cond-mat.mtrl-sci2017

Real-time X-ray Monitoring of the Nucleation and Growth of AlN Epitaxial Films on Sapphire (0001)

Guangxu Ju, Matthew J. Highland, Jeffrey A. Eastman +4

We report the results of x-ray scattering studies of AlN on c-plane sapphire during reactive radiofrequency magnetron sputtering. The sensitivity of in situ x-ray measurements allo…