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20172020
most citedPersistence of Island Arrangements During Layer-by-Layer Growth Revealed Using Coherent X-rays

41 citations · 84 across the 8 of their papers we have counts for

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Showing cond-mat.mtrl-sciShow all

7 papers · 1 filter

cond-mat.mtrl-sci2020★ 6 cited

Burton-Cabrera-Frank theory for surfaces with alternating step types

Guangxu Ju, Dongwei Xu, Carol Thompson +5

Burton-Cabrera-Frank (BCF) theory has proven to be a versatile framework to relate surface morphology and dynamics during crystal growth to the underlying mechanisms of adatom diff…

cond-mat.mtrl-sci2020★ 6 cited

Crystal Truncation Rods from Miscut Surfaces with Alternating Terminations

Guangxu Ju, Dongwei Xu, Carol Thompson +5

Miscut surfaces of layered crystals can exhibit a stair-like sequence of terraces having periodic variation in their atomic structure. For hexagonal close-packed and related crysta…

cond-mat.mtrl-sci2020

Dynamics of Atomic Steps on GaN (0001) during Vapor Phase Epitaxy

Guangxu Ju, Dongwei Xu, Carol Thompson +5

Images of the morphology of GaN (0001) surfaces often show half-unit-cell-height steps separating a sequence of terraces having alternating large and small widths. This can be expl…

cond-mat.mtrl-sci2020★ 15 cited

In Situ Microbeam Surface X-ray Scattering Reveals Alternating Step Kinetics During Crystal Growth

Guangxu Ju, Dongwei Xu, Carol Thompson +5

The stacking sequence of hexagonal close-packed and related crystals typically results in steps on vicinal {0001} surfaces that have alternating A and B structures with different g…

cond-mat.mtrl-sci2018★ 41 cited

Persistence of Island Arrangements During Layer-by-Layer Growth Revealed Using Coherent X-rays

Guangxu Ju, Dongwei Xu, Matthew J. Highland +7

Understanding surface dynamics during epitaxial film growth is key to growing high quality materials with controllable properties. X-ray photon correlation spectroscopy (XPCS) usin…

cond-mat.mtrl-sci2017

Real-time X-ray Monitoring of the Nucleation and Growth of AlN Epitaxial Films on Sapphire (0001)

Guangxu Ju, Matthew J. Highland, Jeffrey A. Eastman +4

We report the results of x-ray scattering studies of AlN on c-plane sapphire during reactive radiofrequency magnetron sputtering. The sensitivity of in situ x-ray measurements allo…

cond-mat.mtrl-sci2017★ 16 cited

An instrument for advanced in situ x-ray studies of metal-organic vapor phase epitaxy of III-nitrides

Guangxu Ju, Matthew J. Highland, Angel Yanguas-Gil +6

We describe an instrument that exploits the ongoing revolution in synchrotron sources, optics, and detectors to enable in situ studies of metal-organic vapor phase epitaxy (MOVPE)…