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R. Rai

4 papers hereh-index 7252 citations25 works total

Matching runs newest-first, so older work may not be attached to this profile yet.

author position
  • first author2
  • middle author2

Across the 4 of 4 papers where every author was matched, so the position is known.

fields
  • cond-mat.mtrl-sci2
  • physics.ins-det2
same name
  • R. Rai — 7 papers, h 14
  • R. Rai — 4 papers

Either other researchers who publish under this name, or the same person where the external sources have not merged their records.

identity via Semantic Scholar / OpenAlex

most citedX-ray diffraction line profile analysis of KBr thin films

7 citations · 7 across the 1 of their papers we have counts for

collaborators

4 papers

physics.ins-det2018

Humidity effects on evolution of CsI thin Films: Fractal studies of rough surfaces

Nabeel Jammal, R. P. Yadav, Triloki +3

The present work investigates the morphological, micro-structural, compositional and fractal analysis for CsI thin films in case of "as-deposited" and "1 hour humid air aged". The…

physics.ins-det2018

Structural and optical properties of CsI thin films: Influence of film thickness and humidity

Nabeel Jammal, Richa Rai, Triloki +1

Structural and optical studies have been performed on the thermally-evaporated "as-deposited" and "humid air aged" CsI thin films. The structural analysis for both "as-deposited" a…

cond-mat.mtrl-sci2018

Growth evolution of self-affine thermally evaporated KBr thin films: A fractal assessment

R. Rai, R. P. Yadav, Triloki +3

In this article, fractal concepts were used to explore the thermally evaporated potassium bromide thin films of different thicknesses 200, 300, and 500 nm respectively; grown on al…

cond-mat.mtrl-sci2017★ 7 cited

X-ray diffraction line profile analysis of KBr thin films

R. Rai, Triloki, B. K. Singh

In the present work, the microcrystalline characteristics of KBr thin films have been investigated by evaluating the breadth of diffraction peak. The Williamson-Hall, the Size-Stra…

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