1 citations · 1 across the 2 of their papers we have counts for
2 papers
physics.optics2025
Natural van der Waals canalization lens for non-destructive nanoelectronic circuit imaging and inspection
Qingdong Ou, Shuwen Xue, Weiliang Ma +13
Optical inspection has long served as a cornerstone non-destructive method in semiconductor wafer manufacturing, particularly for surface and defect analysis. However, conventional…
physics.app-ph2017★ 1 cited
Kirigami-based Elastic Metamaterials with Anisotropic Mass Density for Subwavelength Flexural Wave Control
R. Zhu, H. Yasuda, G. L. Huang +1
A novel design of an elastic metamaterial with anisotropic mass density is proposed to manipulate flexural waves at a subwavelength scale. The three-dimensional metamaterial is ins…