36 citations · 190 across the 15 of their papers we have counts for
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The characterization of Co-nanoparticles supported on graphene
Paul Bazylewski, Danil W. Boukhvalov, Andrey I. Kukharenko +7
The results of density functional theory (DFT) calculations and measurements of X-ray photoelectron (XPS) and X-ray emission (XES) spectra of Co-nanoparticles dispersed on graphene…
Electronic structure and magnetic properties of graphene/Co composites
I. S. Zhidkov, N. A. Skorikov, A. V. Korolev +4
The results of measurements of XPS spectra and magnetic properties of graphene/Co composites prepared by adding of CoClx6HO diluted in ethyl alcohol to highly-splitted grap…
Characterization of TiAlSiON Coatings Deposited by Plasma Enhanced Magnetron Sputtering: XRD, XPS, and DFT Studies
A. S. Kamenetskih, A. I. Kukharenko, E. Z. Kurmaev +6
The results of characterization of TiAlSiON hard coatings deposited on ferric-chromium AISI 430 stainless steel by plasma enhanced magnetron sputtering are presented. The coating w…
Characterization of solution processed TiOx buffer layers in inverted organic photovoltaics by XPS and DFT studies
Ivan S. Zhidkov, Ernst Z. Kurmaev, Michel A. Korotin +5
We present the results of XPS measurements (core levels and valence bands) of solution processed TiOx thin films prepared from titanium butoxide (C16H36O4Ti) diluted in isopropanol…
Modification of titanium and titanium dioxide surfaces by ion implantation: combined XPS and DFT study
D. W. Boukhvalov, D. M. Korotin, A. I. Efremov +7
The results of XPS measurements (core levels and valence bands) of P+, Ca+, P+Ca+ and Ca+P+ ion implanted (E=30 keV, D=1x1017 cm-2) commercially pure titanium (cp-Ti) and first-pri…
Local structure of Fe impurity atoms in ZnO: bulk versus surface
J. A. McLeod, D. W. Boukhvalov, D. A. Zatsepin +9
By studying Fe-doped ZnO pellets and thin films with various x-ray spectroscopic techniques, and complementing this with density functional theory calculations, we find that Fe-dop…
Structural defects induced by Fe-ion implantation in TiO2
B. Leedahl, D. A. Zatsepin, D. W. Boukhvalov +8
X-ray photoelectron spectroscopy (XPS) and resonant x-ray emission spectroscopy (RXES) measurements of pellet and thin film forms of TiO with implanted Fe ions are presented an…