36 citations · 190 across the 15 of their papers we have counts for
15 papers
Fundamental Crystal Field Excitations in Magnetic Semiconductor SnO:Mn,Fe,Co,Ni
B. Leedahl, D. J. McCloskey, D. W. Boukhvalov +7
Directly measuring elementary electronic excitations in dopant metals is essential to understanding how they function as part of their host material. Through calculated crysta…
XPS evidence of degradation mechanism in hybrid halide perovskites
I. S. Zhidkov, A. I. Poteryaev, A. Kukharenko +6
The paper presents the results of measurements of XPS valence band spectra of SiO2/MAPbI3 hybrid perovskites subjected to irradiation with visible light and annealing at an exposur…
Atomic and electronic structure of graphene oxide/Cu interface
Danil W. Boukhvalov, Ernst Z. Kurmaev, Ewelina Urbańczyk +8
The results of X-ray photoemission (XPS) and valence bands spectroscopy, optically stimulated electron emission (OSEE) measurements and density functional theory based modeling of…
Stability of boron-doped graphene/copper interface: DFT, XPS and OSEE studies
D. W. Boukhvalov, I. S. Zhidkov, A. I. Kukharenko +4
Two different types of boron-doped graphene/copper interfaces synthesized using two different flow rates of Ar through the bubbler containing the boron source were studied. X-ray p…
Atomic and electronic structures of stable linear carbon chains on Ag-nanoparticles
D. W. Boukhvalov, I. S. Zhidkov, E. Z. Kurmaev +3
In this work, we report X-ray photoelectron (XPS) and valence band (VB) spectroscopy measurements of surfactant-free silver nanoparticles and silver/linear carbon chains (Ag@LCC) s…
Atomic and electronic structure of a copper/graphene interface as prepared and 1.5 years after
D. W. Boukhvalov, P. F. Bazylewski, A. I. Kukharenko +6
We report the results of X-ray spectroscopy and Raman measurements of as-prepared graphene on a high quality copper surface and the same materials after 1.5 years under different c…
The characterization of Co-nanoparticles supported on graphene
P. Bazylewski, D. W. Boukhvalov, A. I. Kukharenko +6
The results of density functional theory calculations and measurements using X-ray photoelectron spectroscopy of Co-nanoparticles dispersed on graphene/Cu are presented. It is foun…
XPS and DFT study of Sn incorporation into ZnO and TiO2 host matrices by pulsed ion implantation
D. A. Zatsepin, D. W. Boukhvalov, E. Z. Kurmaev +5
Bulk and thin films ZnO and TiO2 samples were doped with Sn by pulsed ion implantation and studied by means of X-ray photoelectron core-level and valence band spectroscopy as well…
The characterization of Co-nanoparticles supported on graphene
Paul Bazylewski, Danil W. Boukhvalov, Andrey I. Kukharenko +7
The results of density functional theory (DFT) calculations and measurements of X-ray photoelectron (XPS) and X-ray emission (XES) spectra of Co-nanoparticles dispersed on graphene…
Electronic structure and magnetic properties of graphene/Co composites
I. S. Zhidkov, N. A. Skorikov, A. V. Korolev +4
The results of measurements of XPS spectra and magnetic properties of graphene/Co composites prepared by adding of CoClx6HO diluted in ethyl alcohol to highly-splitted grap…
Characterization of TiAlSiON Coatings Deposited by Plasma Enhanced Magnetron Sputtering: XRD, XPS, and DFT Studies
A. S. Kamenetskih, A. I. Kukharenko, E. Z. Kurmaev +6
The results of characterization of TiAlSiON hard coatings deposited on ferric-chromium AISI 430 stainless steel by plasma enhanced magnetron sputtering are presented. The coating w…
Characterization of solution processed TiOx buffer layers in inverted organic photovoltaics by XPS and DFT studies
Ivan S. Zhidkov, Ernst Z. Kurmaev, Michel A. Korotin +5
We present the results of XPS measurements (core levels and valence bands) of solution processed TiOx thin films prepared from titanium butoxide (C16H36O4Ti) diluted in isopropanol…
Modification of titanium and titanium dioxide surfaces by ion implantation: combined XPS and DFT study
D. W. Boukhvalov, D. M. Korotin, A. I. Efremov +7
The results of XPS measurements (core levels and valence bands) of P+, Ca+, P+Ca+ and Ca+P+ ion implanted (E=30 keV, D=1x1017 cm-2) commercially pure titanium (cp-Ti) and first-pri…
Local structure of Fe impurity atoms in ZnO: bulk versus surface
J. A. McLeod, D. W. Boukhvalov, D. A. Zatsepin +9
By studying Fe-doped ZnO pellets and thin films with various x-ray spectroscopic techniques, and complementing this with density functional theory calculations, we find that Fe-dop…
Structural defects induced by Fe-ion implantation in TiO2
B. Leedahl, D. A. Zatsepin, D. W. Boukhvalov +8
X-ray photoelectron spectroscopy (XPS) and resonant x-ray emission spectroscopy (RXES) measurements of pellet and thin film forms of TiO with implanted Fe ions are presented an…