most citedAutomatic Support Removal for Additive Manufacturing Post Processing

42 citations · 178 across the 11 of their papers we have counts for

collaborators

11 papers

cs.CG201922 cited

Exploring Feasible Design Spaces for Heterogeneous Constraints

Amir M. Mirzendehdel, Morad Behandish, Saigopal Nelaturi

We demonstrate an approach of exploring design spaces to simultaneously satisfy kinematics- and physics-based requirements. We present a classification of constraints and solvers t…

cs.CG20195 cited

Automated Process Planning for Turning: A Feature-Free Approach

Morad Behandish, Saigopal Nelaturi, Chaman Singh Verma +1

Turning is the most commonly available and least expensive machining operation, in terms of both machine-hour rates and tool insert prices. A practical CNC process planner has to m…

cs.CG201916 cited

A Classification of Topological Discrepancies in Additive Manufacturing

Morad Behandish, Amir M. Mirzendehdel, Saigopal Nelaturi

Additive manufacturing (AM) enables enormous freedom for design of complex structures. However, the process-dependent limitations that result in discrepancies between as-designed a…

cs.CG201942 cited

Automatic Support Removal for Additive Manufacturing Post Processing

Saigopal Nelaturi, Morad Behandish, Amir M. Mirzendehdel +1

An additive manufacturing (AM) process often produces a {\it near-net} shape that closely conforms to the intended design to be manufactured. It sometimes contains additional suppo…

cs.HC2017

Haptic Assembly and Prototyping: An Expository Review

Morad Behandish, Horea T. Ilies

An important application of haptic technology to digital product development is in virtual prototyping (VP), part of which deals with interactive planning, simulation, and verifica…

cs.CG20173 cited

Shape Complementarity Analysis for Objects of Arbitrary Shape

Morad Behandish, Horea T. Ilies

The basic problem of shape complementarity analysis appears fundamental to applications as diverse as mechanical design, assembly automation, robot motion planning, micro- and nano…